Electron diffraction phenomena for very low energy electrons

Comment on "Reliability of low-energy electron diffraction for studies of surface order-disorder phenomena"

Electron energy loss and diffraction of backscattered electrons from silicon

Electrons backscattered from crystals can show Kikuchi patterns: variations in intensity for different outgoing directions due to diffraction by the lattice. Here, we measure these effects as a function of their energy loss for 30 keV electrons backscattered from silicon. The change in diffraction contrast with energy loss depends strongly on the scattering geometry. At steep incidence on the s...

DNA damage induced by low-energy electrons: electron transfer and diffraction.

Thin films of the short single strand of DNA, GCAT, in which guanine (G) or adenine (A) have been removed, were bombarded under vacuum by 4 to 15 eV electrons. The fragments corresponding to base release and strand breaks (SB) were analyzed by high performance liquid chromatography and their yields compared with those obtained from unmodified GCAT. From such a comparison, it is shown that, usin...

Theory of Low-Energy Electron Diffraction

A method for calculating the intensities of diffracted waves in low energy electron diffraction by crystals is proposed. The elastic multiple scattering is fully taken into account. The cellular method of KOHN and ROSTOKER in the band theory of metals is applied to the integral equation of the scattering by two dimensional lattices, particularly by monatomic layers. The solution is expanded in ...

Very Low Energy Scanning Electron Microscopy

Very low energy scanning electron microscopy is introduced as a scanning version of the low energy electron microscopy, i.e. the emission electron microscopy with the sample excited by means of a parallel wave of electrons. The incident primary electrons are retarded in the cathode lens consisting of a negatively biased sample (cathode) and earthed anode. Interaction of slow electrons with soli...